English | 中文版 | 手机版 企业登录 | 个人登录 | 邮件订阅
当前位置 > 产品目录 > 显微系统 > 显微镜附件/滤光片 > AFM探针 单晶金刚石探针 Adama导电探针
AFM探针 单晶金刚石探针 Adama导电探针
英文名称:Diamond Probes AFM探针总访问:777
国产/进口:进口半年访问:55
产地/品牌:美国/Adama产品类别:显微镜附件/滤光片
型       号:AD-40-SS 最后更新:2023-6-12
货       号:
参考报价:1400
立即询价 电话咨询
[发表评论] [本类其他产品] [本类其他供应商] [收藏]
销售商: 上海寰太电子科技有限公司 查看该公司所有产品 >>
  • 产品介绍
  • 公司简介
【技术参数】
金刚石扫描探针
 
   
型号 AD-40-SS
制造厂商 Adama
探针描述 导电金刚石镀层探针;硅基探针
类型 轻敲模式
应用 普通样品,扫描形貌
 
【产品详情】
悬臂描述
Lever 1 2 3 4
Spring k (N/m) 40(20 - 60) - - -
Freq (kHz) 180 (100- 300) - - -
Length (µm) 225 (215 - 235) - - -
Width (µm) 28 (23- 33) - - -
Thickness (µm) 3(2.5 - 3.5) - - -
Shape Rectangular - - -
Material Diamond coated Silicon - - -
Reflex Coating (nm) Glod - - -
 
针尖描述
Tip radius (nm) <5
Tip height (µm) 300 +/- 100
Front angle (°) 25 +/- 5
Back angle (°) 15 +/- 5
Side angle (°) 22.5 +/- 5
Tip shape Cone
Tip material Silicon
Tip coating (nm) doped diamond
 
Overview
Super Sharp Conductive Single Crystal Diamond Probes, 40 N/m, 180 kHz, <5 nm ROC, 5-Pack

Super sharp tip for highest resolution combined with high spring constant, suitable for higher force and harder sample applications including:

- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
 
All Adama probes are now included in the Sader Method - Global Calibration Initiative.


 
 
Tip Specification
 
Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm·cm. Contact resistance is typically 10 k? depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Tip Height (h): 12.5 ± 2.5 µm
Front Angle (FA): 25 ± 5º
Back Angle (BA): 15 ± 5º
Side Angle (SA): 22.5 ± 5º
 
Cantilever Specification
AD-40-SS Cantilever Image
Cantilever Schematic
Material: Single Crystal Diamond
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0µm
Cantilever Thickness (RNG): 2.5 - 3.5µm
Back Side Coating: Reflective Au

 
bio-equip.com
售后服务
如您有任何的问题或者探针选购等问题,请您随时联系我们售后服务:
上海展悦电子科技有限公司
郑小姐
18017933200(微信同号)
相关视频
资料下载
快速询价登录注册在线询价 (请留下您的联系方式,以便供应商联系您)
* 姓  名:
* 地  区:
* 单  位:
职  位:
* 手机/电话:
* E-mail:
请寄产品资料:
需要 不需要
请报价格:
需要报价 不需要报价
留  言:
验证码:
换一张
我希望获得多家供应商报价
发表评论在线评论(0条)
手机版:AFM探针 单晶金刚石探针 Adama导电探针
搜索本类产品

Copyright(C) 1998-2025 生物器材网 电话:021-64166852;13621656896 E-mail:info@bio-equip.com
立即询价