Overview
Super Sharp Conductive Single Crystal Diamond Probes, 40 N/m, 180 kHz, <5 nm ROC, 5-Pack
Super sharp tip for highest resolution combined with high spring constant, suitable for higher force and harder sample applications including:
- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
Super sharp tip for highest resolution combined with high spring constant, suitable for higher force and harder sample applications including:
- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
All Adama probes are now included in the Sader Method - Global Calibration Initiative.
Tip Height (h): 12.5 ± 2.5 µm
Front Angle (FA): 25 ± 5º
Back Angle (BA): 15 ± 5º
Side Angle (SA): 22.5 ± 5º
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Material: Single Crystal Diamond
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0µm
Cantilever Thickness (RNG): 2.5 - 3.5µm
Back Side Coating: Reflective Au