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| 销售商： 上海寰太电子科技有限公司 | 查看该公司所有产品 >> |
【技术参数】
【产品详情】
Tip Specification
Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm·cm. Contact resistance is typically 10 k? depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Cantilever Specification
Cantilever Schematic
| 型号 | AD-40-AS |
| 制造厂商 | Adama |
| 探针描述 | 导电金刚石镀层探针;硅基探针 |
| 类型 | 轻敲模式 |
| 应用 | 普通样品,扫描形貌 |
【产品详情】
| 悬臂描述 | |||||
 |
Lever | 1 | 2 | 3 | 4 |
| Spring k (N/m) | 40(20 - 60) | - | - | - | |
| Freq (kHz) | 180 (100- 300) | - | - | - | |
| Length (µm) | 225 (215 - 235) | - | - | - | |
| Width (µm) | 28 (17 - 33) | - | - | - | |
| Thickness (µm) | 3.0(2.5 - 3.5) | - | - | - | |
| Shape | Rectangular | - | - | - | |
| Material | Diamond coated Silicon | - | - | - | |
| Reflex Coating (nm) | Glod | - | - | - | |
| 针尖描述 | ||
 |
Tip radius (nm) | 10 +/- 5 |
| Tip height (µm) | 300 +/- 100 | |
| Front angle (°) | 25 +/- 5 | |
| Back angle (°) | 15 +/- 5 | |
| Side angle (°) | 22.5 +/- 5 | |
| Tip shape | Cone | |
| Tip material | Silicon | |
| Tip coating (nm) | doped diamond | |
Overview
Sharp Conductive Single Crystal Diamond Probes, 40 N/m, 180 kHz, 10 nm ROC, 5-Pack
High spring constant, suitable for higher force and harder sample applications including:
- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
High spring constant, suitable for higher force and harder sample applications including:
- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
All Adama probes are now included in the Sader Method - Global Calibration Initiative.
Tip Height (h): 12.5 ± 2.5 µm
Front Angle (FA): 25 ± 5º
Back Angle (BA): 15 ± 5º
Side Angle (SA): 22.5 ± 5º
Material: Single Crystal Diamond
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0µm
Cantilever Thickness (RNG): 2.5 - 3.5µm
如您有任何的问题或者探针选购等问题，请您随时联系我们售后服务：
上海展悦电子科技有限公司
郑小姐
18017933200（微信同号）
上海展悦电子科技有限公司
郑小姐
18017933200（微信同号）
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